Paper
28 March 2014 Work smarter not harder: How to get more results with less modeling
Kareem Madkour, Fedor Pikus, Mohab Anis
Author Affiliations +
Abstract
In this paper we study the importance of accurate model-based simulation on characterization of the integrated circuit performance. We analyze device sensitivity to process variability and its impact on circuit timing. We show that only a small fraction of devices whose characteristics are significantly affected by process variability actually have correspondingly significant effect on the overall circuit performance. We suggest several ways to use this observation to improve robustness of circuits. We see that a significant fraction of devices is affected by the layout context and should be considered sensitive. However, and it is especially true in large designs, only a small fraction of these devices is critical for the circuit performance. Obviously, to make the design more robust we have to avoid devices which are both sensitive and critical
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kareem Madkour, Fedor Pikus, and Mohab Anis "Work smarter not harder: How to get more results with less modeling", Proc. SPIE 9053, Design-Process-Technology Co-optimization for Manufacturability VIII, 905311 (28 March 2014); https://doi.org/10.1117/12.2046086
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Transistors

Lithography

Model-based design

Resolution enhancement technologies

Performance modeling

Design for manufacturing

Optical proximity correction

Back to Top