Paper
21 May 2014 Multiple-order staircase etalon spectroscopy
M. K. Yetzbacher, C. W. Miller, A. J. Boudreau, M. Christophersen, M. J. Deprenger
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Abstract
Traditional Fabry-Perot (FP) spectroscopy is bandwidth limited to avoid mixing signals from different transmission orders of the interferometer. Unlike Fourier transformation, the extraction of spectra from multiple-order interferograms resulting from multiplexed optical signals is in general an ill-posed problem. Using a Fourier transform approach, we derive a generalized Nyquist limit appropriate to signal recovery from FP interferograms. This result is used to derive a set of design rules giving the usable wavelength range and spectral resolution of FP interferometers or etalon arrays given a set of accessible physical parameters. Numerical simulations verify the utility of these design rules for moderate resolution spectroscopy with bandwidths limited by the detector spectral response. Stable and accurate spectral recovery over more than one octave is accomplished by simple matrix multiplication of the interferogram. In analogy to recently developed single-order micro-etalon arrays (Proc. of SPIE v.8266, no. 82660Q), we introduce Multiple-Order Staircase Etalon Spectroscopy (MOSES), in which micro-arrays of multiple order etalons can be bonded to or co-fabricated with a sensor array. MOSES enables broader bandwidth multispectral and hyperspectral instruments than single-order etalon arrays while keeping a physical footprint insignificantly different from that of the detection array.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. K. Yetzbacher, C. W. Miller, A. J. Boudreau, M. Christophersen, and M. J. Deprenger "Multiple-order staircase etalon spectroscopy", Proc. SPIE 9101, Next-Generation Spectroscopic Technologies VII, 910104 (21 May 2014); https://doi.org/10.1117/12.2049848
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CITATIONS
Cited by 5 scholarly publications and 2 patents.
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KEYWORDS
Fabry–Perot interferometers

Reflectivity

Spectroscopy

Optical filters

Sensors

Spectral resolution

Multiplexing

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