Polarization measurement through combination polarizers

Yunfeng Bai; Linjun Li; Zhelong He; Yanwei Liu; Cheng Ma; Guang Shi; Lu Liu

doi:10.1117/12.2054191

21 February 2014 Polarization measurement through combination polarizers

Yunfeng Bai, Linjun Li, Zhelong He, Yanwei Liu, Cheng Ma, Guang Shi, Lu Liu

Proceedings Volume 9142, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics: Optical Imaging, Remote Sensing, and Laser-Matter Interaction 2013; 91421L (2014) https://doi.org/10.1117/12.2054191
Event: Selected Proceedings of the Photoelectronic Technology Committee Conferences held July-December 2013, 2013, SuZhou, China

Abstract

Polarization measurement approaches only using polarizer and grating is present. The combination polarizers consists of two polarizers: one is γ degree with the X axis; the other is along the Y axis. Binary grating is covered by the combination polarizers, and based on Fraunhofer diffraction, the diffraction intensity formula is deduced. The polarization state of incident light can be gotten by fitting the diffraction pattern with the deduced formula. Compared with the traditional polarization measurement method, this measurement only uses polarizer and grating, therefore, it can be applied to measure a wide wavelength range without replacing device in theory.

Citation Download Citation

Yunfeng Bai, Linjun Li, Zhelong He, Yanwei Liu, Cheng Ma, Guang Shi, and Lu Liu "Polarization measurement through combination polarizers", Proc. SPIE 9142, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics: Optical Imaging, Remote Sensing, and Laser-Matter Interaction 2013, 91421L (21 February 2014); https://doi.org/10.1117/12.2054191

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