Paper
16 March 2015 A microwave radiometric method to obtain the average path profile of atmospheric temperature and humidity structure parameters and its application to optical propagation system assessment
Robert M. Manning, Brian Vyhnalek
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Abstract
The values of the key atmospheric propagation parameters CT2 , CQ2 , and CTQ are highly dependent upon the vertical height within the atmosphere thus making it necessary to specify profiles of these values along the atmospheric propagation path. The remote sensing method suggested and described in this work makes use of a rapidly integrating microwave profiling radiometer to capture profiles of temperature and humidity through the atmosphere. The integration times of currently available profiling radiometers are such that they are approaching the temporal intervals over which one can possibly make meaningful assessments of these key atmospheric parameters. Since these parameters are fundamental to all propagation conditions, they can be used to obtain Cn2 profiles for any frequency, including those for an optical propagation path. In this case the important performance parameters of the prevailing isoplanatic angle and Greenwood frequency can be obtained. The integration times are such that Kolmogorov turbulence theory and the Taylor frozen-flow hypothesis must be transcended. Appropriate modifications to these classical approaches are derived from first principles and an expression for the structure functions are obtained. The theory is then applied to an experimental scenario and shows very good results.
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Robert M. Manning and Brian Vyhnalek "A microwave radiometric method to obtain the average path profile of atmospheric temperature and humidity structure parameters and its application to optical propagation system assessment", Proc. SPIE 9354, Free-Space Laser Communication and Atmospheric Propagation XXVII, 935406 (16 March 2015); https://doi.org/10.1117/12.2080258
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Cited by 1 scholarly publication.
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KEYWORDS
Radiometry

Atmospheric propagation

Humidity

Atmospheric optics

Temperature metrology

Profiling

Turbulence

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