Paper
6 March 2015 Application of harmonic analysis method based on two-dimensional Fourier transform to flatness error sampling
Yu Wang, Xingwang Li, Dongdong Ma, Fugui Huang
Author Affiliations +
Proceedings Volume 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation; 94460A (2015) https://doi.org/10.1117/12.2084029
Event: International Symposium on Precision Engineering Measurement and Instrumentation, 2014, Changsha/Zhangjiajie, China
Abstract
The flatness errors of several different parts were sampled from a Coordinate Measuring Machine and then the harmonic characteristics of flatness errors were analyzed by observing the three-dimensional frequency spectrum obtained by calculating the data through Two-Dimensional Fast Fourier Transform. It was found through experiment and analysis that each harmonic component of a flatness error is generally similar if the processing system is reliable, i.e. the highest harmonic wavelength of a random error is infinite, and Nyquist Sampling Theorem can not be applied to directly verify flatness error sampling points.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yu Wang, Xingwang Li, Dongdong Ma, and Fugui Huang "Application of harmonic analysis method based on two-dimensional Fourier transform to flatness error sampling", Proc. SPIE 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation, 94460A (6 March 2015); https://doi.org/10.1117/12.2084029
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KEYWORDS
Error analysis

Fourier transforms

Data acquisition

Statistical analysis

3D imaging standards

Analytical research

MATLAB

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