Paper
6 March 2015 Discuss on traceability method of light-scattering airborne particle counter’s counting performance
Qizheng Ji, Zhiliang Gao, Xunbiao Zhang, Jian Chen
Author Affiliations +
Proceedings Volume 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation; 94464C (2015) https://doi.org/10.1117/12.2181958
Event: International Symposium on Precision Engineering Measurement and Instrumentation, 2014, Changsha/Zhangjiajie, China
Abstract
The traceability of light-scattering airborne particle counter’s counting performance has received more attention, but has failed to settle internationally. This paper puts forward a traceability method of light-scattering airborne particle counter’s counting performance on single particle size, based on Anodic Aluminum Oxide (AAO) template andScanning Electron Microscope (SEM), by reforming the traditional standard airborne particle counter, building a measurement system including AAO and SEM, and utilizing the method of statistical physics in data processing to obtain more accurate measurement results. According to the actual test results and its uncertainty analysis, the traceability method of light-scattering airborne particle counter’s counting performance based on AAO and SEM makes sense in theory, and has certain research value on a solution to the traceability problem of light-scattering airborne particle counter internationally.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Qizheng Ji, Zhiliang Gao, Xunbiao Zhang, and Jian Chen "Discuss on traceability method of light-scattering airborne particle counter’s counting performance", Proc. SPIE 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation, 94464C (6 March 2015); https://doi.org/10.1117/12.2181958
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KEYWORDS
Particles

Scanning electron microscopy

Atmospheric particles

Error analysis

Light scattering

Physics

Calibration

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