Development of a soft x-ray ptychography beamline at SSRL and its application in the study of energy storage materials

Anna M. Wise; Hendrik Ohldag; William Chueh; Joshua Turner; Michael F. Toney; Johanna Nelson Weker

doi:10.1117/12.2188811

18 September 2015 Development of a soft x-ray ptychography beamline at SSRL and its application in the study of energy storage materials

Anna M. Wise, Hendrik Ohldag, William Chueh, Joshua Turner, Michael F. Toney, Johanna Nelson Weker

Author Affiliations +

Proceedings Volume 9592, X-Ray Nanoimaging: Instruments and Methods II; 95920B (2015) https://doi.org/10.1117/12.2188811
Event: SPIE Optical Engineering + Applications, 2015, San Diego, California, United States

Abstract

Ptychography is an emerging high resolution coherent imaging technique which can improve the resolution of current scanning transmission X-ray microscopy systems by over ten-fold. Development of this capability is underway at Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, to establish sub-5 nm resolution ptychographic imaging with spatially resolved near-edge X-ray absorption fine structure spectroscopy. This is being achieved via an upgrade of the current soft X-ray scanning transmission X-ray microscope at beamline 13-1, involving the installation of an area detector and an interferometer system for high precision sample motor control. The undulator source on beamline 13-1 provides the spatially and temporally coherent X-ray beam required for ptychographic imaging in the energy range 500 – 1200 eV. This energy range allows access to the oxygen chemistry and the valence states of 3d transition metals found in energy storage materials, making soft x-ray ptychography a particularly powerful tool to study the chemical states and structure of battery materials at relevant length scales. The implementation of ptychographic imaging can therefore provide a wealth of additional information on battery operation and failure. Here we describe the development of this ptychography capability, along with its application to the study of energy storage materials.

Citation Download Citation

Anna M. Wise, Hendrik Ohldag, William Chueh, Joshua Turner, Michael F. Toney, and Johanna Nelson Weker "Development of a soft x-ray ptychography beamline at SSRL and its application in the study of energy storage materials", Proc. SPIE 9592, X-Ray Nanoimaging: Instruments and Methods II, 95920B (18 September 2015); https://doi.org/10.1117/12.2188811

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available