Paper
5 April 1989 Particulate Debris From Pulsed Electron Bombardment Of Optical Baffle Materials.
S R Henion, E A Johnson, J A Johnson, P F Meroth, G T Stribley
Author Affiliations +
Abstract
One radiation damage mechanism which has caused particular concern for optical baffle materials is particulate blow-oft. This is an important consideration in the design of advanced optical systems, since particles ejected from the surface of a baffle may foul nearby mirrors and provide a significant source of stray light. To assess the extent of the blow-off problem. and in order to design optical systems which are imo,une to this problem, it is important to know number of particles ejected as well as their size, direction, and speed. We have conducted experiments with several commercial baffle materials to illustrate the nature of the problem and provide insight into the physical phenomena involved.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S R Henion, E A Johnson, J A Johnson, P F Meroth, and G T Stribley "Particulate Debris From Pulsed Electron Bombardment Of Optical Baffle Materials.", Proc. SPIE 0967, Stray Light and Contamination in Optical Systems, (5 April 1989); https://doi.org/10.1117/12.948116
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Cited by 2 scholarly publications.
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KEYWORDS
Particles

Contamination

Stray light

Microscopes

Optical design

Mirrors

Electron beams

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