Paper
15 March 2016 The effects of heavy ion radiation on digital micromirror device performance
Anton Travinsky, Dmitry Vorobiev, Alan D. Raisanen, Jonathan Pellish, Zoran Ninkov, Massimo Robberto, Sara Heap
Author Affiliations +
Abstract
There is a need for a space-suitable solution to the selection of targets to be observed in astronomical multiobject spectrometers (MOS). A few digital micromirror device (DMD) - based prototype MOS have been developed for use at ground observatories, However their main use will come in deploying a space based mission. The question of DMD performance under in-orbit radiation remains unanswered. DMDs were tested under accelerated heavy-ion radiation (with the control electronics shielded from radiation), with a focus on detection of single-event effects (SEEs) including latch-up events. Testing showed that DMDs are sensitive to non-destructive ion-induced state changes; however, all SEEs were cleared with a soft reset (that is, sending a new pattern to the device). The DMDs did not experience single-event induced permanent damage or functional changes that required a hard reset (power cycle), even at high ion fluences. This suggests that the SSE rate burden will be manageable for a DMD-based instrument when exposed to solar particle fluxes and cosmic rays on orbit.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anton Travinsky, Dmitry Vorobiev, Alan D. Raisanen, Jonathan Pellish, Zoran Ninkov, Massimo Robberto, and Sara Heap "The effects of heavy ion radiation on digital micromirror device performance", Proc. SPIE 9761, Emerging Digital Micromirror Device Based Systems and Applications VIII, 976108 (15 March 2016); https://doi.org/10.1117/12.2213634
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Cited by 1 scholarly publication.
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KEYWORDS
Digital micromirror devices

Mirrors

Ions

Micromirrors

Argon

Krypton

Xenon

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