Paper
9 December 2015 Error analysis of large aperture static interference imaging spectrometer
Author Affiliations +
Proceedings Volume 9808, International Conference on Intelligent Earth Observing and Applications 2015; 98081V (2015) https://doi.org/10.1117/12.2209637
Event: International Conference on Intelligent Earth Observing and Applications, 2015, Guilin, China
Abstract
Large Aperture Static Interference Imaging Spectrometer is a new type of spectrometer with light structure, high spectral linearity, high luminous flux and wide spectral range, etc ,which overcomes the contradiction between high flux and high stability so that enables important values in science studies and applications. However, there’re different error laws in imaging process of LASIS due to its different imaging style from traditional imaging spectrometers, correspondingly, its data processing is complicated. In order to improve accuracy of spectrum detection and serve for quantitative analysis and monitoring of topographical surface feature, the error law of LASIS imaging is supposed to be learned. In this paper, the LASIS errors are classified as interferogram error, radiometric correction error and spectral inversion error, and each type of error is analyzed and studied. Finally, a case study of Yaogan-14 is proposed, in which the interferogram error of LASIS by time and space combined modulation is mainly experimented and analyzed, as well as the errors from process of radiometric correction and spectral inversion.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fan Li and Guo Zhang "Error analysis of large aperture static interference imaging spectrometer", Proc. SPIE 9808, International Conference on Intelligent Earth Observing and Applications 2015, 98081V (9 December 2015); https://doi.org/10.1117/12.2209637
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Spectroscopy

Charge-coupled devices

Distortion

Error analysis

Image registration

Calibration

Hyperspectral imaging

Back to Top