Bi/Si interface and Bi nanolines characterization by surface differential reflectivity

Viktor V. Buchenko; Andrey A. Goloborodko

doi:10.1117/12.2218069

30 November 2015 Bi/Si interface and Bi nanolines characterization by surface differential reflectivity

Viktor V. Buchenko, Andrey A. Goloborodko

Proceedings Volume 9809, Twelfth International Conference on Correlation Optics; 98090N (2015) https://doi.org/10.1117/12.2218069
Event: 12th International Conference on Correlation Optics, 2015, Chernivsti, Ukraine

Abstract

The influence of Bi/Si(001) interfaces and Bi nanolines on Si(001) surface on the reflectance properties of two-phase systems is discussed in ultra-high vacuum, by means of two different surface optical spectroscopies: the Surface Differential Reflectance Spectroscopy and the Reflectance Anisotropy Spectroscopy. Specific spectra are obtained, which are interpreted as a function of the surface modification mode. In particular, it is possible to discriminate between Bi/Si interfaces with different thickness and Bi nanolines on Si surface. Moreover, quantitative information is proposed from these optical techniques which yields the determination of the number (or concentration) of surface Si and Bi atoms involved in the bonding.

Citation Download Citation

Viktor V. Buchenko and Andrey A. Goloborodko "Bi/Si interface and Bi nanolines characterization by surface differential reflectivity", Proc. SPIE 9809, Twelfth International Conference on Correlation Optics, 98090N (30 November 2015); https://doi.org/10.1117/12.2218069

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