Presentation + Paper
12 September 2016 Design and manufacture of imaging time-of-propagation optics
Mike Albrecht, James Fast, Alan Schwartz
Author Affiliations +
Abstract
There are several challenges associated with the design and manufacture of the optics required for the imaging time-of- propagation detector constructed for the Belle II particle physics experiment. This detector uses Cherenkov light radiated in quartz bars to identify subatomic particles: pions, kaons, and protons. The optics are physically large (125 cm x 45 cm x 2 cm bars and 45 cm x 10 cm x 5 cm prisms), all surfaces are optically polished, and there is very little allowance for chamfers or surface defects. In addition to the optical challenges, there are several logistical and handling challenges associated with measuring, assembling, cleaning, packaging, and shipping these delicate precision optics. This paper describes a collaborative effort between Pacific Northwest National Laboratory, the University of Cincinnati, and ZYGO Corporation for the design and manufacture of 48 fused silica optics (30 bars and 18 prisms) for the iTOP Detector. Details of the iTOP detector design that drove the challenging optical requirements are provided, along with material selection considerations. Since the optics are so large, precise, and delicate, special care had to be given to the selection of a manufacturing process capable of achieving the challenging optical and surface defect requirements on such large and high-aspect-ratio (66:1) components. A brief update on the current status and performance of these optics is also provided.
Conference Presentation
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mike Albrecht, James Fast, and Alan Schwartz "Design and manufacture of imaging time-of-propagation optics", Proc. SPIE 9969, Radiation Detectors: Systems and Applications XVII, 99690C (12 September 2016); https://doi.org/10.1117/12.2238833
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Optics manufacturing

Prisms

Sensors

Surface finishing

Charged particle optics

Photons

Particles

RELATED CONTENT

MRF, ELSM and STED tools to study defects in...
Proceedings of SPIE (November 14 2013)
Subsurface damage on ground fused silica surfaces
Proceedings of SPIE (August 06 2014)
Low temperature GRISM direct bonding
Proceedings of SPIE (September 02 2015)

Back to Top