Photoelectronic techniques for subnanosecond evaluation of laser-material interactions and dynamic material properties

Dennis L. Paisley

doi:10.1117/12.142074

1 April 1993 Photoelectronic techniques for subnanosecond evaluation of laser-material interactions and dynamic material properties

Dennis L. Paisley

Author Affiliations +

Proceedings Volume 1982, Photoelectronic Detection and Imaging: Technology and Applications '93; (1993) https://doi.org/10.1117/12.142074
Event: Photoelectronic Detection and Imaging: Technology and Applications '93, 1993, Beijing, China

Abstract

Photoelectronic techniques provide the highest temporal resolution for dynamic material interaction studies. Optical signals from a velocity interferometer (VISAR) are coupled by fiber optics to the slit plane of an electronic streak camera. Temporal resolution of < 100 ps has been realized. Laser-launched miniature flat plates as thin as 1 micrometers have been launched to 4 km/s resulting in an impact pulse duration of approximately 0.3 ns at > 30 GPa. Miniature plates are being used to study grain and sub-grain size effects of metals and ceramics. The small size of the experiment permits evaluation of: (1) spall strength at strain rates > 10⁷, (2) local grain size effects, (3) grain boundaries, (4) shock and release all within one grain thickness, (5) small samples of valuable or toxic materials, (6) bond strengths between similar or different materials, (7) Hugoniot elastic limits, and (8) separation of elastic-plastic shock velocities. Dynamic properties of metals at grain and sub-grain size affects are just now being investigated experimentally. This presentation discuses the status of work in progress and the application of photoelectronic techniques for data collection and analysis.

Citation Download Citation

Dennis L. Paisley "Photoelectronic techniques for subnanosecond evaluation of laser-material interactions and dynamic material properties", Proc. SPIE 1982, Photoelectronic Detection and Imaging: Technology and Applications '93, (1 April 1993); https://doi.org/10.1117/12.142074

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available