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Proceedings Article

Cryogenic cooled silicon-based x-ray optical elements: heat load limit

[+] Author Affiliations
Lin Zhang

European Synchrotron Radiation Facility (France)

Proc. SPIE 1997, High Heat Flux Engineering II, 223 (November 12, 1993); doi:10.1117/12.163803
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From Conference Volume 1997

  • High Heat Flux Engineering II
  • Ali M. Khounsary
  • San Diego, CA | July 11, 1993

abstract

A silicon block (typical size 100 X 100 X (20 - 50) mm3) cooled by liquid nitrogen has been studied with various incident power densities and spot sizes on the surface. Gaussian power distribution was assumed. Both bottom cooling and side cooling have been considered. The thermal slope error has been minimized by optimizing the cooling conditions (cooling coefficient and bulk temperature of liquid nitrogen) and the thickness of the silicon block. Finite element analysis has been used because the material properties ((alpha) , k) of silicon are highly non linear. The limits of absorbed total power and power density are estimated for both undulator and wiggler beams with various spot sizes and for the requirement in terms of thermal slope error. Correlations between thermal slope error and power, power density have been established.

© (1993) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Lin Zhang
"Cryogenic cooled silicon-based x-ray optical elements: heat load limit", Proc. SPIE 1997, High Heat Flux Engineering II, 223 (November 12, 1993); doi:10.1117/12.163803; http://dx.doi.org/10.1117/12.163803


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