Full Content is available to subscribers

Subscribe/Learn More  >
Proceedings Article

Nonradiative energy back transfer from erbium in silicon by impurity Auger process

[+] Author Affiliations
Jorg Palm, F. Gan, Lionel C. Kimerling

Massachusetts Institute of Technology (USA)

Proc. SPIE 2706, Tenth Feofilov Symposium on Spectroscopy of Crystals Activated by Rare-Earth and Transitional-Metal Ions, 31 (January 3, 1996); doi:10.1117/12.229162
Text Size: A A A
From Conference Volume 2706

  • Tenth Feofilov Symposium on Spectroscopy of Crystals Activated by Rare-Earth and Transitional-Metal Ions
  • Alexander I. Ryskin; V. F. Masterov
  • St. Petersburg, Russia | July 03, 1995

abstract

The investigations of the temperature dependence of intensity and decay time of the photoluminescence of Erbium in silicon show that the luminescence quenching is caused by a nonradiative energy back transfer from the excited Erbium. The electroluminescence decay is studied by applying different bias conditions during the decay. In a two-beam experiment the PL decay is monitored for different background excitation laser powers. The observed changes of the decay time are a strong evidence for the impurity auger effect as an efficient luminescence quenching mechanism of erbium in silicon. It is also shown that the fast initial luminescence decay component is related to the quenching by excess carriers. The power dependence, the decay profiles with two components and the two-beam experiment can be simulated by solving a set of rate equations considering the formation of excitons, the decrease of pumping efficiency by exciton auger recombination and the decrease of radiation efficiency by the impurity auger effect with free electrons.

© (1996) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Jorg Palm ; F. Gan and Lionel C. Kimerling
"Nonradiative energy back transfer from erbium in silicon by impurity Auger process", Proc. SPIE 2706, Tenth Feofilov Symposium on Spectroscopy of Crystals Activated by Rare-Earth and Transitional-Metal Ions, 31 (January 3, 1996); doi:10.1117/12.229162; http://dx.doi.org/10.1117/12.229162


Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).

Figures

Tables

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.