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Proceedings Article

Laser-induced surface thermal lensing for thin film characterizations

[+] Author Affiliations
Zhouling Wu, S. T. Gu

Eastern Michigan Univ. (USA)

Pao-Kuang Kuo, Y. S. Lu

Wayne State Univ. (USA)

Proc. SPIE 2714, 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995, 294 (May 27, 1996); doi:10.1117/12.240357
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From Conference Volume 2714

  • 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995
  • Harold E. Bennett; Arthur H. Guenther; Mark R. Kozlowski; Brian E. Newnam; M. J. Soileau
  • Boulder, CO | October 30, 1995

abstract

Laser-induced surface deformation is a widely used technique for studying thin film coatings. In this technique the deformation is typically detected by using the well-known optical beam deflection technique. In this paper we report a different technique in studying the deformation by using optical diffraction effect. In this detection scheme the laser-induced thermal bump behaves as a curved reflection mirror which can either focus or defocus a second probe laser beam through optical diffraction, depending on the specific geometry used. This surface thermal lensing effect is demonstrated to be a sensitive and easy-to-handle method for thin film characterization. The potentials of this technique and its advantages over the conventional method for thin film absorption measurement and defect characterization are discussed.

© (1996) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Zhouling Wu ; Pao-Kuang Kuo ; Y. S. Lu and S. T. Gu
"Laser-induced surface thermal lensing for thin film characterizations", Proc. SPIE 2714, 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995, 294 (May 27, 1996); doi:10.1117/12.240357; http://dx.doi.org/10.1117/12.240357


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