Full Content is available to subscribers

Subscribe/Learn More  >
Proceedings Article

Dual-mode infrared and radar hardware-in-the-loop test assets at the Johns Hopkins University Applied Physics Laboratory

[+] Author Affiliations
Thomas E. O'Bannon, Scott A. Gearhart

Johns Hopkins Univ. (USA)

Proc. SPIE 2741, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing, 332 (May 24, 1996); doi:10.1117/12.241110
Text Size: A A A
From Conference Volume 2741

  • Technologies for Synthetic Environments: Hardware-in-the-Loop Testing
  • Robert Lee Murrer, Jr.
  • Orlando, FL | April 08, 1996

abstract

Several next-generation air defense missiles will use dual- mode guidance systems that simultaneously employ RF and IR sensors to obtain significant improvements in guidance performance. These missiles will require sophisticated hardware-in-the-loop test facilities to provide controlled signal environments to each sensor. Such test facilities allow accurate characterization of RF and IR sensors as well as the development and validation of guidance algorithms. Two approaches for dual-mode hardware-in-the-loop testing used at The Johns Hopkins University Applied Physics Laboratory (APL) are `electrically connected' and `collocated.' Each uses a common central computer to precisely coordinate RF and IR environment generators. The electrically connected approach requires disassembly of the guidance section and locating RF and IR seekers in different rooms. Extended electrical interfaces couple the seekers to the missile's guidance computer. This arrangement is well suited for development testing where flexibility is the primary concern. In the collocated configuration, disassembly of the guidance system is not needed since the RF and IR test environment generators are built into a common facility. This noninvasive configuration is useful in identifying and resolving performance issues associated with an integrated guidance system. This paper describes the capabilities and status of the collocated dual-mode Guidance System Evaluation Laboratory developed at APL.

© (1996) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Thomas E. O'Bannon and Scott A. Gearhart
"Dual-mode infrared and radar hardware-in-the-loop test assets at the Johns Hopkins University Applied Physics Laboratory", Proc. SPIE 2741, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing, 332 (May 24, 1996); doi:10.1117/12.241110; http://dx.doi.org/10.1117/12.241110


Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).

Figures

Tables

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.