Paper
18 September 1996 Resonant scanning tunneling optical microscope
Claudine Bainier, Daniel A. Courjon, J. Salvi, Fadi Baida, Christian Girard, Jean-Marie Vigoureux, A. Castiaux
Author Affiliations +
Proceedings Volume 2782, Optical Inspection and Micromeasurements; (1996) https://doi.org/10.1117/12.250788
Event: Lasers, Optics, and Vision for Productivity in Manufacturing I, 1996, Besancon, France
Abstract
It has been shown recently that a configuration combining near field detection and Fabry-Perot resonator offers a solution for increasing the signal to noise ratio. In this communication we use this conference as an interferometric imaging device. The basic idea behind this concept is that one way for enhancing the low sensitivity of such microscopes could consist of increasing the field intensity between tip and sample by either using a multi-reflection system such as a classical Fabry-Perot cavity or by using some more sophisticated multi-reflection devices.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Claudine Bainier, Daniel A. Courjon, J. Salvi, Fadi Baida, Christian Girard, Jean-Marie Vigoureux, and A. Castiaux "Resonant scanning tunneling optical microscope", Proc. SPIE 2782, Optical Inspection and Micromeasurements, (18 September 1996); https://doi.org/10.1117/12.250788
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KEYWORDS
Optical microscopes

Scanning tunneling microscopy

Fabry–Perot interferometers

Imaging devices

Interferometry

Microscopes

Near field

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