0

Full Content is available to subscribers

Subscribe/Learn More  >
Proceedings Article

Grating-tuned semiconductor MOPA lasers for precision spectroscopy

[+] Author Affiliations
John H. Marquardt, Flavio C. Cruz, Michelle Stephens, Chris W. Oates, Leo W. Hollberg, James C. Bergquist

National Institute of Standards and Technology (USA)

David F. Welch, David G. Mehuys, Steve Sanders

SDL, Inc. (USA)

Proc. SPIE 2834, Application of Tunable Diode and Other Infrared Sources for Atmospheric Studies and Industrial Process Monitoring, 34 (October 21, 1996); doi:10.1117/12.255336
Text Size: A A A
From Conference Volume 2834

  • Application of Tunable Diode and Other Infrared Sources for Atmospheric Studies and Industrial Process Monitoring
  • Alan Fried
  • Denver, CO | August 04, 1996

abstract

A standard grating-tuned extended-cavity diode laser is used for injection seeding of a tapered semiconductor laser/amplifier. With sufficient injection power the output of the amplifier takes on the spectral characteristics of the master laser. We have constructed master-oscillator power-amplifier systems that operator near 657 nm, 675 nm, 795 nm, and 850 nm. Although the characteristics vary from system to system, we have demonstrated output powers of greater than 700 mW in a single spatial mode, linewidths less than 1 kHz, coarse tuning greater than 20 nm, and continuous single-frequency scanning greater than 150 GHz. We discuss the spectroscopic applications of these high power, highly coherent, tunable diode lasers as applied to Ca, Hg+, I2, and two-photon transitions in Cs.

© (1996) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

John H. Marquardt ; Flavio C. Cruz ; Michelle Stephens ; Chris W. Oates ; Leo W. Hollberg, et al.
"Grating-tuned semiconductor MOPA lasers for precision spectroscopy", Proc. SPIE 2834, Application of Tunable Diode and Other Infrared Sources for Atmospheric Studies and Industrial Process Monitoring, 34 (October 21, 1996); doi:10.1117/12.255336; http://dx.doi.org/10.1117/12.255336


Access This Article
Sign In to Access Full Content
Please Wait... Processing your request... Please Wait.
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
 

Figures

Tables

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement


Buy this article ($18 for members, $25 for non-members).
Sign In