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Proceedings Article

Fullerene tips for scanning probe microscopy

[+] Author Affiliations
Kevin F. Kelly, Dipankar Sarkar, Stephen J. Oldenburg, Gregory D. Hale, Naomi J. Halas

Rice Univ. (USA)

Proc. SPIE 2854, Fullerenes and Photonics III, 114 (December 16, 1996); doi:10.1117/12.262973
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From Conference Volume 2854

  • Fullerenes and Photonics III
  • Zakya H. Kafafi
  • Denver, CO, United States | August 04, 1996

abstract

We have succeeded in adsorbing individual C60 molecules onto the tunneling region of an STM tip. The individual tip- adsorbed molecules are imaged by scanning the fullerene- adsorbed tip over a defect covered graphite surface. The nanometer-size defects serve as a surface tip array which 'inverse images' the molecules adsorbed to the tip when the surface is scanned. These tips were subsequently used to observe threefold symmetric electron scattering from point defects on a graphite surface, an effect that could not be observed using bare metal tips. Functionalizing an STM tip with an appropriate molecule adsorbate alters the density of states near the Fermi level of the tip and changes its imaging characteristics.

© (1996) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Kevin F. Kelly ; Dipankar Sarkar ; Stephen J. Oldenburg ; Gregory D. Hale and Naomi J. Halas
"Fullerene tips for scanning probe microscopy", Proc. SPIE 2854, Fullerenes and Photonics III, 114 (December 16, 1996); doi:10.1117/12.262973; http://dx.doi.org/10.1117/12.262973


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