Full Content is available to subscribers

Subscribe/Learn More  >
Proceedings Article

Mueller matrix polarimetry of electro-optic PLZT spatial light modulators

[+] Author Affiliations
Elizabeth A. Sornsin, Russell A. Chipman

Univ. of Alabama in Huntsville (USA)

Proc. SPIE 2873, International Symposium on Polarization Analysis and Applications to Device Technology, 196 (August 16, 1996); doi:10.1117/12.246217
Text Size: A A A
From Conference Volume 2873

  • International Symposium on Polarization Analysis and Applications to Device Technology
  • Toru Yoshizawa; Hideshi Yokota
  • Yokohama, Japan | June 12, 1996

abstract

Mueller matrix polarimetry has been used to determine operational efficiency and material quality in lead- lanthanum-zirconium-titanate (PLZT) electro-optic modulators. PLZT is a transparent, quadratic electro-optic ceramic which is a candidate for the next generation of electro-optic interconnects and modulating devices. The Polarimetry group at the University of Alabama in Huntsville has measured Mueller matrices for several sample devices. The purpose of this study was to evaluate the optical quality of the transmissive PLZT devices, determine the uniformity of the modulation across the active area, and calculate the quadratic electro-optic coefficients. High- resolution imaging polarimetry has demonstrated the uniformity of the polarizing and polarization-scrambling properties of a bulk PLZT spatial light modulator array. The Mueller Matrix Imaging Polarimeter was used to produce magnified maps of device regions; this data provides insight to the material uniformity, proper contact of drive electrodes, distribution of the applied electric fields, and quality of the surface. Light scattering from ceramic grain boundaries was also observed to result in some depolarization of light exiting the device. A single-channel Mueller matrix polarimeter measured spatially-averaged device performance for a range of applied operating voltages. This information easily determined the electro- optic coefficients for the modulating material. Several chemical vapor deposited thin-film PLZT devices were studied, and the quadratic electro-optic coefficients compared favorably to that for bulk PLZT.

© (1996) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Elizabeth A. Sornsin and Russell A. Chipman
"Mueller matrix polarimetry of electro-optic PLZT spatial light modulators", Proc. SPIE 2873, International Symposium on Polarization Analysis and Applications to Device Technology, 196 (August 16, 1996); doi:10.1117/12.246217; http://dx.doi.org/10.1117/12.246217


Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).

Figures

Tables

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.