Novel wavelength measurement scheme using a stabilized interferometric system

Wen-Jiang Shi; Yanong N. Ning; Kenneth T. V. Grattan; Andrew W. Palmer; Shanglian Huang

doi:10.1117/12.252139

24 September 1996 Novel wavelength measurement scheme using a stabilized interferometric system

Wen-Jiang Shi, Yanong N. Ning, Kenneth T. V. Grattan, Andrew W. Palmer, Shanglian Huang

Proceedings Volume 2895, Fiber Optic Sensors V; (1996) https://doi.org/10.1117/12.252139
Event: Photonics China '96, 1996, Beijing, China

Abstract

A novel interferometric detection scheme for measuring wavelength shift in an optical sensing system is described. In this scheme, in addition to the source wavelength to be measured, a further reference wavelength is employed to stabilize the optical path difference of the interferometer. This is designed to make the wavelength detection system insensitive to environment disturbances such as temperature fluctuation and mechanical vibration, and using this scheme a signal-to-noise ratio improvement of 25 db has been demonstrated.

Citation Download Citation

Wen-Jiang Shi, Yanong N. Ning, Kenneth T. V. Grattan, Andrew W. Palmer, and Shanglian Huang "Novel wavelength measurement scheme using a stabilized interferometric system", Proc. SPIE 2895, Fiber Optic Sensors V, (24 September 1996); https://doi.org/10.1117/12.252139

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