Paper
11 December 1996 Micro-object handling system with concentrated visual fields and new handling skills
Koichi Koyano, Tomomasa Sato
Author Affiliations +
Proceedings Volume 2906, Microrobotics: Components and Applications; (1996) https://doi.org/10.1117/12.260617
Event: Photonics East '96, 1996, Boston, MA, United States
Abstract
This paper proposes a system design concept of a 'concentrated visual field' for micro object handling. The proposed concept features: (1) multiple microscopes, (2) fields of view concentrated on manipulators' work space, and (3) rotational DOF for tilting manipulators and a worktable. Micro Object Handling System II, which consists of two microscopes (a scanning electron microscope and an optical microscope), two manipulators (primary and secondary) and a worktable, is constructed based on the design concept. The primary manipulator is equipped with two rotational DOFs, and three highly precise translational DOFs. The secondary manipulator is utilized to fix objects on the worktable. The paper also proposes new micro object handling skills to control the adhesive forces which are crucial for micromanipulation. These skills feature: (1) graspless handling of an object by a needlelike tool, (2) changing adhesive force between a tool and an object by changing the contact area between them, and (3) cooperating two tools whose adhesive forces differ. Several micro object handling experiments were successfully performed by the system to prove the feasibility of the new handling skills and the system effectiveness.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Koichi Koyano and Tomomasa Sato "Micro-object handling system with concentrated visual fields and new handling skills", Proc. SPIE 2906, Microrobotics: Components and Applications, (11 December 1996); https://doi.org/10.1117/12.260617
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CITATIONS
Cited by 4 scholarly publications and 1 patent.
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KEYWORDS
Adhesives

Microscopes

Visualization

Scanning electron microscopy

Electron microscopes

Actuators

Optical scanning systems

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