Paper
2 May 1997 Measurement-based depth of focus
Stephanie L. Ellenberger, Ian T. Young
Author Affiliations +
Abstract
An important point in the automated evaluation of molecular cytogenetic preparations is focusing the specimen before taking images. The in-focus position can vary for different positions on the slide, thus every new field of view has to be refocused. Another problem is that objects in one field of view can lie in different planes with the effect that one object is out-of-focus while the other one is in-focus. We want to investigate the importance of focus with regard to measurements like object intensity. Diffraction wave theory leads to a formula, which can be used to determine the depth-of-focus (DOF), the tolerance in the in-focus position where the image is still sharp. However practice shows that it is possible to get good measurement results even if the specimen is not imaged perfectly.the relation between the theoretical and practical DOF is analyzed. The objects under investigation are either 2D or 3D and are imaged in absorption and fluorescence mode. It appears that the DOF based on measurements can be 5 to 10 times bigger than a DOF based on wave theory with only little loss of accuracy.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stephanie L. Ellenberger and Ian T. Young "Measurement-based depth of focus", Proc. SPIE 2982, Optical Diagnostics of Biological Fluids and Advanced Techniques in Analytical Cytology, (2 May 1997); https://doi.org/10.1117/12.273648
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Cited by 2 scholarly publications.
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KEYWORDS
Objectives

3D image processing

Optical spheres

3D metrology

Microscopes

Optical transfer functions

Point spread functions

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