Studies Of Polish Layers On Infrared Window Materials By Ellipsometry

D. K. Burge; P. A. Temple

doi:10.1117/12.955548

19 October 1977 Studies Of Polish Layers On Infrared Window Materials By Ellipsometry

D. K. Burge, P. A. Temple

Proceedings Volume 0112, Optical Polarimetry: Instrumentation and Applications; (1977) https://doi.org/10.1117/12.955548
Event: 21st Annual Technical Symposium, 1977, San Diego, United States

Abstract

Ellipsometric measurements at 5461 Å on etched and mechanically polished samples of KC1 are reported. The results show that (1) etched KC1 has a refractive index nearly equal to the bulk value (1.49); (2) polished KC1 samples have a damaged surface layer with indices of 1.42 to 1.45, but there is an ambiguity in the thickness of this layer; and (3) the difference in refractive index between the bulk and surface values has a positive correlation with the increase in total absorption at 10.6 μm measured for the sample. Preliminary measurements on polished CaF2 are also given.

Citation Download Citation

D. K. Burge and P. A. Temple "Studies Of Polish Layers On Infrared Window Materials By Ellipsometry", Proc. SPIE 0112, Optical Polarimetry: Instrumentation and Applications, (19 October 1977); https://doi.org/10.1117/12.955548

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