Application Of Interferometry And Holography For Precision Measurements

Hans J. Tiziani

doi:10.1117/12.943686

27 March 1985 Application Of Interferometry And Holography For Precision Measurements

Hans J. Tiziani

Proceedings Volume 0492, 1984 European Conf on Optics, Optical Systems, and Applications; (1985) https://doi.org/10.1117/12.943686
Event: 1984 European Conference on Optics, Optical Systems and Applications, 1984, Amsterdam, Netherlands

Abstract

Phase measurement techniques are becoming a useful tool for precision measurements. Spatial as well as temporal phase shift methods can be used. Optical testing, where computer analysis of interference fringes is becoming increasing important, will be discussed in connection with testing optical components,microprofilbs as well as for testing aspheric surfaces. In addition, methods using heterodyne techniques and real time holography will be described.

Citation Download Citation

Hans J. Tiziani "Application Of Interferometry And Holography For Precision Measurements", Proc. SPIE 0492, 1984 European Conf on Optics, Optical Systems, and Applications, (27 March 1985); https://doi.org/10.1117/12.943686

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