Paper
18 April 1985 Inorganic Resists Based On Photo-Doped As-S Films
A. P. Firth, P. J.S. Ewen, A. E. Owen, C. M. Huntley
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Abstract
In recent years there has been considerable interest in inorganic resist systems based on the photo-doping of amorphous chalcogenide films, the majority of the research being devoted to Ge-Se films. This paper presents a detailed investigation of inorganic resists based on the photo-doping of Ag into As-S films. It is shown that high resolution patterns can be produced in such resists using holography or optical lithography and that they are compatible with wet-chemical or plasma etching. Structural studies using Raman spectro-scopy indicate that for best resolution the composition of the As-S film should be close to AS33S67 since on photo-doping it will yield a single-phase homogeneous material. A possible mechanism for the photo-doping process is described based on a tarnishing-type photo-chemical reaction. It is shown that the actinic radiation initiating the photo-dissolution effect is absorbed primarily in the photo-doped layer, close to the interface with the undoped As-S region.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. P. Firth, P. J.S. Ewen, A. E. Owen, and C. M. Huntley "Inorganic Resists Based On Photo-Doped As-S Films", Proc. SPIE 0539, Advances in Resist Technology and Processing II, (18 April 1985); https://doi.org/10.1117/12.947829
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Cited by 24 scholarly publications.
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KEYWORDS
Silver

Electrons

Interfaces

Glasses

Arsenic

Gold

Ions

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