Narrow Band Imagery In The 8-14 Micron Spectral Region

J. H. Goebel; N. Moss; M. Cohen; C. R. McCreight; F. C. Witteborn; D. Rank; W. Wisnewski

doi:10.1117/12.936533

6 November 1986 Narrow Band Imagery In The 8-14 Micron Spectral Region

J. H. Goebel, N. Moss, M. Cohen, C. R. McCreight, F. C. Witteborn, D. Rank, W. Wisnewski

Proceedings Volume 0686, Infrared Detectors, Sensors, and Focal Plane Arrays; (1986) https://doi.org/10.1117/12.936533
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

The problem of deconvolution of the point source response function (PSF) for two dimensional imaging infrared arrays is addressed. A variety of phenomena can lead to PSF degradation ranging from atmospheric turbulence to the array itself. The maximum entropy (MEM) algorithm is used to demonstrate that substantial image quality improvements are possible in the case of a PSF which is degraded by electronic rather than optical smearing. This result implies that IR arrays need not have perfect or even very good pixel-pixel crosstalk rejection ratios for use in astronomy.

Citation Download Citation

J. H. Goebel, N. Moss, M. Cohen, C. R. McCreight, F. C. Witteborn, D. Rank, and W. Wisnewski "Narrow Band Imagery In The 8-14 Micron Spectral Region", Proc. SPIE 0686, Infrared Detectors, Sensors, and Focal Plane Arrays, (6 November 1986); https://doi.org/10.1117/12.936533

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