0

Full Content is available to subscribers

Subscribe/Learn More  >
Proceedings Article

TEM and X-Ray Analysis of Multilayer Mirrors and Beamsplitters

[+] Author Affiliations
D. G. Stearns, N. M. Ceglio, A. M. Hawryluk

University of California (United States)

M. B. Stearns, A. K. Petford-Long, C -H. Chang

Arizona State University (United States)

K. Danzmann, M. Kuhne, P. Muller, B. Wende

Institute Berlin (Germany)

Proc. SPIE 0688, Multilayer Structures & Laboratory X-Ray Laser Research, 91 (April 9, 1987); doi:10.1117/12.964827
Text Size: A A A
From Conference Volume 0688

  • Multilayer Structures & Laboratory X-Ray Laser Research
  • Natale M. Ceglio; Pierre Dhez
  • San Diego | August 01, 1986

abstract

Recent advances in the development of lasers at soft x-ray wavelengths has spurred increasing interest in the production of cavity components using multilayer technology. We have established a comprehensive capability to design, fabricate, and characterize multilayer x-ray optics directed towards the goal of building the first x-ray laser cavity. High quality multilayer structures have been fabricated using magnetron sputtering. In addition, we have applied microfabrication technology to create freestanding beamsplitters and three-dimensional diffracting structures, as is discussed in another paper at this conference. The x-ray reflectivity and transmission of the multilayer components have been measured using synchrotron radiation. We have also characterized the microstructure of these devices using high-resolution transmission electron microscopy (TEM). This information provides structural parameters that are incorporated into computer codes to calculate the theoretical performance of the multilayer components. Comparison of the calculated reflectivity and transmission with the measured performance of the multilayer optics provides insight into the physics of these devices. In addition, a successful modeling capability allows us to iterate the fabrication cycle, modifying the design of the multilayer components to optimize their performance.

© (1987) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

D. G. Stearns ; N. M. Ceglio ; A. M. Hawryluk ; M. B. Stearns ; A. K. Petford-Long, et al.
"TEM and X-Ray Analysis of Multilayer Mirrors and Beamsplitters", Proc. SPIE 0688, Multilayer Structures & Laboratory X-Ray Laser Research, 91 (April 9, 1987); doi:10.1117/12.964827; http://dx.doi.org/10.1117/12.964827


Access This Article
Sign In to Access Full Content
Please Wait... Processing your request... Please Wait.
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
 

Figures

Tables

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement


Buy this article ($18 for members, $25 for non-members).
Sign In