Paper
26 August 1987 Vibration Control in Sub-nanometre Metrology
D. G. Chetwynd
Author Affiliations +
Proceedings Volume 0732, 1st Intl Conf on Vibration Control in Optics and Metrology; (1987) https://doi.org/10.1117/12.937906
Event: 1st International Conference on Vibrational Control in Optics and Metrology, 1987, London, United Kingdom
Abstract
The use of X-ray interferometry makes possible the calibration of microdisplacement transducers to precisions of around 10 pm on a relatively routine basis. Naturally, this is not achieved without careful mechanical design, especially with regard to vibration isolation and thermal stability. A facility has been constructed, and is described here, for the evaluation of this method. Its performance when operating with a single-crystal silicon monolithic interferometer is examined. In many respects the system design follows conventional patterns, for example in using a high mass base supported on active air-springs. However, as the most sensitive parts are required to have controlled motion while in operation, particular attention is paid to the active force-loops. A solenoid-based force transducer is shown to have ideal characteristics for this application.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. G. Chetwynd "Vibration Control in Sub-nanometre Metrology", Proc. SPIE 0732, 1st Intl Conf on Vibration Control in Optics and Metrology, (26 August 1987); https://doi.org/10.1117/12.937906
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Cited by 4 scholarly publications.
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