Ultrafast Optical Waveform Characterization New Trend Of Ultrafast Streak Camera Technology

Yutaka Tsuchiya; Musubu Koishi

doi:10.1117/12.969146

7 June 1989 Ultrafast Optical Waveform Characterization New Trend Of Ultrafast Streak Camera Technology

Yutaka Tsuchiya, Musubu Koishi

Proceedings Volume 1032, 18th Intl Congress on High Speed Photography and Photonics; (1989) https://doi.org/10.1117/12.969146
Event: 18th International Congress on High Speed Photography and Photonics, 1988, Xi'an, Shaanxi, China

Abstract

Waveform measurement of ultrafast optical signals is discussed as a promising application field of the streak camera technology. The key techniques for such measurement are elliptical scan and electron sampling. The optical oscilloscopes, which we have recently developed to perform the measurement mentioned above, are discussed on its operation and results of practical measurement. The results have showed excellent performances such as the time resolution of = 10 ps, the wide dynamic range of > 1:10 3, and distortionless, which features are far exceeding the limits of measurement by ordinary technique.

Citation Download Citation

Yutaka Tsuchiya and Musubu Koishi "Ultrafast Optical Waveform Characterization New Trend Of Ultrafast Streak Camera Technology", Proc. SPIE 1032, 18th Intl Congress on High Speed Photography and Photonics, (7 June 1989); https://doi.org/10.1117/12.969146

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