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Proceedings Article

Tip-based nanofabrication: an approach to true nanotechnology

[+] Author Affiliations
Kristen P. Bloschock, Adam R. Schofield

System Planning Corp. (USA)

Thomas W. Kenny

Stanford Univ. (USA)

Proc. SPIE 8031, Micro- and Nanotechnology Sensors, Systems, and Applications III, 803102 (May 13, 2011); doi:10.1117/12.887266
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From Conference Volume 8031

  • Micro- and Nanotechnology Sensors, Systems, and Applications III
  • Orlando, Florida, USA | April 25, 2011

abstract

True nanotechnology, defined as the ability to reliably and repeatably fabricate nanostructures with controlled differences in size, shape, and orientation at precise substrate locations, currently does not exist. There are many examples demonstrating the capability to grow, deposit, and manipulate nanometer-sized features, but typically these techniques do not allow for controllable manufacturing of individual structures. To bridge this gap and to unlock the true potential of nanotechnology for defense sensing applications, the Defense Advanced Research Projects Agency (DARPA) launched the Tip-Based Nanofabrication (TBN) research program with the intent of achieving controlled manufacturing of nanostructures using functionalized AFM cantilevers and tips. This work describes the background, goals, and recent advances achieved during the multi-year TBN program.

© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation

Kristen P. Bloschock ; Adam R. Schofield and Thomas W. Kenny
"Tip-based nanofabrication: an approach to true nanotechnology", Proc. SPIE 8031, Micro- and Nanotechnology Sensors, Systems, and Applications III, 803102 (May 13, 2011); doi:10.1117/12.887266; http://dx.doi.org/10.1117/12.887266


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