Fabrication and characterization of Cd0.9Zn0.1Te Schottky diodes for nuclear radiation detectors

Krishna C. Mandal; Peter G. Muzykov; Ramesh M. Krishna; Timothy C. Hayes

doi:10.1117/12.896640

27 September 2011 Fabrication and characterization of Cd_0.9Zn_0.1Te Schottky diodes for nuclear radiation detectors

Krishna C. Mandal, Peter G. Muzykov, Ramesh M. Krishna, Timothy C. Hayes

Proceedings Volume 8142, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII; 81421B (2011) https://doi.org/10.1117/12.896640
Event: SPIE Optical Engineering + Applications, 2011, San Diego, California, United States

Abstract

We have fabricated and characterized cadmium zinc telluride (CZT) Schottky diodes with low reverse leakage current for high resolution radiation detector applications. The diodes were made using Cd0.9Zn0.1Te detector grade crystals grown by the low temperature tellurium solvent method. The diodes were characterized using electron beam induced current (EBIC) technique to investigate crystallographic defects. The EBIC images were correlated with transmission infrared (TIR) images of CZT crystals and the EBIC contrast was attributed to the nonuniformities in spatial distribution of Te. Further characterization by the thermally stimulated current (TSC) spectroscopy revealed shallow and deep level centers with activation energies 0.25- 0.4 eV and 0.65 - 0.8 eV respectively, which we attribute to intrinsic defects associated with excess of Te. Pulse height spectra (PHS) measurements were carried out using a 241Am (59.6 keV) radiation source on the Frisch collar radiation detectors made from the suitable portions of the CZT ingot used for Schottky diode fabrication, and an energy resolution of ~4.2% FWHM was obtained.

Citation Download Citation

Krishna C. Mandal, Peter G. Muzykov, Ramesh M. Krishna, and Timothy C. Hayes "Fabrication and characterization of Cd_0.9Zn_0.1Te Schottky diodes for nuclear radiation detectors", Proc. SPIE 8142, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII, 81421B (27 September 2011); https://doi.org/10.1117/12.896640

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available