Study of the laser matter interaction in the femtosecond regime: application to the analysis of the laser damage of optical thin films

B. Mangote; L. Gallais; M. Zerrad; M. Commandré; L. H. Gao; F. Lemarchand; M. Lequime; A. Melninkaitis; J. Mirauskas; V. Sirutkaitis; S. Kicas; T. Tolenis; R. Drazdys; M. Mende; L. Jensen; H. Ehlers; D. Ristau

doi:10.1117/12.897372

4 October 2011 Study of the laser matter interaction in the femtosecond regime: application to the analysis of the laser damage of optical thin films

B. Mangote, L. Gallais, M. Zerrad, M. Commandré, L. H. Gao, F. Lemarchand, M. Lequime, A. Melninkaitis, J. Mirauskas, V. Sirutkaitis, S. Kicas, T. Tolenis, R. Drazdys, M. Mende, L. Jensen, H. Ehlers, D. Ristau

Author Affiliations +

Proceedings Volume 8168, Advances in Optical Thin Films IV; 816815 (2011) https://doi.org/10.1117/12.897372
Event: SPIE Optical Systems Design, 2011, Marseille, France

Abstract

We report an experimental investigation in the laser-induced damage threshold (LIDT) of optical coatings materials. The samples are single layers of Al₂O₃, Nb₂O₅, HfO₂, SiO₂, Ta₂O₅, ZrO₂ deposited through different deposition techniques (evaporation or sputtering with/without ion assistance) and mixtures of Al₂O₃/SiO₂, Nb₂O₅/SiO₂, HfO₂/SiO₂, Ta₂O₅/SiO₂ and ZrO₂/SiO₂ on silica substrates. The LIDT is measured at 1030nm, 500fs in single shot mode. The results are expressed and compared in term of LIDT as a function of bandgap and LIDT as a function of refractive index.

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B. Mangote, L. Gallais, M. Zerrad, M. Commandré, L. H. Gao, F. Lemarchand, M. Lequime, A. Melninkaitis, J. Mirauskas, V. Sirutkaitis, S. Kicas, T. Tolenis, R. Drazdys, M. Mende, L. Jensen, H. Ehlers, and D. Ristau "Study of the laser matter interaction in the femtosecond regime: application to the analysis of the laser damage of optical thin films", Proc. SPIE 8168, Advances in Optical Thin Films IV, 816815 (4 October 2011); https://doi.org/10.1117/12.897372

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