We characterize the influence of surface roughness on resolution and on the transmission coefficient of double layered silver-TiO2 superlenses. Rough surfaces are modelled with a Gaussian statistics based on experimental AFM measurements of e-beam evaporated layers, whereas the rest of the analysis is numerical and is obtained using 2D FDTD. The roughness of a surface is described with the root-mean-square of its height and with the width of its autocorrelation function. Our modelling results confirm that surface roughness is a critical limiting factor for both superresolution and for large transmission efficiency.© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.