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Proceedings Article

Effect of surface roughness on subwavelength imaging with layered metamaterial optical elements

[+] Author Affiliations
T. Stefaniuk, R. Kotynski

Univ. of Warsaw (Poland)

G. Nowak

Institute of High Pressure Physics (Poland)

Proc. SPIE 8070, Metamaterials VI, 807010 (May 18, 2011); doi:10.1117/12.889188
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From Conference Volume 8070

  • Metamaterials VI
  • Vladimir Kuzmiak; Peter Markos; Tomasz Szoplik
  • Prague, Czech Republic | April 18, 2011

abstract

We characterize the influence of surface roughness on resolution and on the transmission coefficient of double layered silver-TiO2 superlenses. Rough surfaces are modelled with a Gaussian statistics based on experimental AFM measurements of e-beam evaporated layers, whereas the rest of the analysis is numerical and is obtained using 2D FDTD. The roughness of a surface is described with the root-mean-square of its height and with the width of its autocorrelation function. Our modelling results confirm that surface roughness is a critical limiting factor for both superresolution and for large transmission efficiency.

© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation

T. Stefaniuk ; G. Nowak and R. Kotynski
"Effect of surface roughness on subwavelength imaging with layered metamaterial optical elements", Proc. SPIE 8070, Metamaterials VI, 807010 (May 18, 2011); doi:10.1117/12.889188; http://dx.doi.org/10.1117/12.889188


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