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Proceedings Article

Polarization entangled states measurement on a chip

[+] Author Affiliations
Linda Sansoni

Univ. degli Studi di Roma La Sapienza (Italy)

Fabio Sciarrino, Paolo Mataloni

Univ. degli Studi di Roma La Sapienza (Italy) and Istituto Nazionale di Ottica Applicata, CNR (Italy)

Giuseppe Vallone

Museo Storico della Fisica e Centro Studi e Ricerche Enrico Fermi (Italy) and Univ. degli Studi di Roma La Sapienza (Italy)

Andrea Crespi, Roberta Ramponi, Roberto Osellame

Istituto di Fotonica e Nanotecnologie, CNR, Istituto Nazionale per la Fisica della Materia (Italy) and Politecnico di Milano (Italy)

Proc. SPIE 8072, Photon Counting Applications, Quantum Optics, and Quantum Information Transfer and Processing III, 80720Q (May 06, 2011); doi:10.1117/12.886485
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From Conference Volume 8072

  • Photon Counting Applications, Quantum Optics, and Quantum Information Transfer and Processing III
  • Ivan Prochazka; Jaromír Fiurásek
  • Prague, Czech Republic | April 18, 2011

abstract

The emerging strategy to overcome the limitations of bulk quantum optics consists of taking advantage of the robustness and compactness achievable by the integrated waveguide technology. Here we report the realization of a directional coupler, fabricated by femtosecond laser waveguide writing, acting as an integrated beam splitter able to support polarization encoded qubits. This maskless and single step technique allows to realize circular transverse waveguide profiles able to support the propagation of Gaussian modes with any polarization state. Using this device, we demonstrate the quantum interference with polarization entangled states.

© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation

Linda Sansoni ; Fabio Sciarrino ; Giuseppe Vallone ; Paolo Mataloni ; Andrea Crespi, et al.
"Polarization entangled states measurement on a chip", Proc. SPIE 8072, Photon Counting Applications, Quantum Optics, and Quantum Information Transfer and Processing III, 80720Q (May 06, 2011); doi:10.1117/12.886485; http://dx.doi.org/10.1117/12.886485


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