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Proceedings Article

The effect of misalignment in phase retrieval based on a spatial light modulator

[+] Author Affiliations
Mostafa Agour

Bremer Institut für angewandte Strahltechnik GmbH (Germany) and South Valley Univ. (Egypt)

Claas Falldorf, Christoph von Kopylow, Ralf B. Bergmann

Bremer Institut für angewandte Strahltechnik GmbH (Germany)

Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 80820M (May 26, 2011); doi:10.1117/12.889200
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From Conference Volume 8082

  • Optical Measurement Systems for Industrial Inspection VII
  • Peter H. Lehmann; Wolfgang Osten; Kay Gastinger
  • Munich, Germany | May 23, 2011

abstract

Recently we have proposed the conception of an innovative experimental scheme for phase retrieval from a set of consecutive intensity measurements. It is based on a 4f-optical filter with a reflective phase-only spatial light modulator (SLM) located in the Fourier domain. The main advantage of this scheme is the greatly reduced measurement time since no mechanical shift is required throughout the capturing process. To recover the phase, the captured intensities have been subjected to an iterative process based on generalized projections. Here, we investigate the influence of misalignment, between the optical axes of the setup, on the performance of the iterative scheme's solution. It is demonstrated that if misalignments is present, measurement errors will be propagated in the iterative process and thus affect the accuracy and the rate of convergence of the phase retrieval. The concept is demonstrated by investigating the wavefield diffracted by the U.S. Air Force resolution target. In the case of an aligned setup, it is shown that only 5 planes and 10 iterations give good reconstructions.

© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation

Mostafa Agour ; Claas Falldorf ; Christoph von Kopylow and Ralf B. Bergmann
"The effect of misalignment in phase retrieval based on a spatial light modulator", Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 80820M (May 26, 2011); doi:10.1117/12.889200; http://dx.doi.org/10.1117/12.889200


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