Paper
27 May 2011 High resolution speckle interferometry by replacing temporal information with spatial information
Y. Arai, T. Inoue, S. Yokozeki
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Abstract
Electronic speckle pattern interferometry using virtual speckle patterns is a high resolution deformation measurement method. Usually, virtual speckle patterns have been produced by Hilbert transform or Carré algorithm. However, there are some problems concerning calculating time and quantity of deformation in the process of producing virtual speckle patterns. In proposed method, virtual speckle patterns are easily produced by replacing temporal information with spatial information on CCD without processing by Fourier transform or Carré algorithm. As the results, calculating cost of virtual speckle patterns is improved. It is confirmed that the new method is equal to ordinary methods in measurement accuracy.
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Y. Arai, T. Inoue, and S. Yokozeki "High resolution speckle interferometry by replacing temporal information with spatial information", Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 80821U (27 May 2011); https://doi.org/10.1117/12.889224
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KEYWORDS
Speckle pattern

Ferroelectric materials

Speckle

Fringe analysis

Charge-coupled devices

Speckle interferometry

Fourier transforms

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