Paper
23 February 2006 Investigation of 3D microscopy using intensity diffraction tomography
Author Affiliations +
Abstract
Diffraction tomography (DT) is an established imaging technique for reconstructing the complex-valued refractive index distribution of a weakly scattering 3D sample. Due to experimental difficulties associated with the direct measurement of the phase of an optical wavefield, the effectiveness of DT for optical imaging applications has been limited. A theory of intensity diffraction tomography (I-DT) has been proposed to circumvent this phase retrieval problem. In this work, we review the features of I-DT reconstruction theory that are relevant to optical microscopy. Computer-simulation studies are conducted to investigate the performance of reconstruction algorithms for a proposed I-DT microscope. The effects of data noise are assessed, and statistically optimal reconstruction strategies that employ multiple detector planes are proposed.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mark A. Anastasio, Yin Huang, Greg Gbur, and P. Scott Carney "Investigation of 3D microscopy using intensity diffraction tomography", Proc. SPIE 6090, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIII, 60900G (23 February 2006); https://doi.org/10.1117/12.648169
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Cited by 1 scholarly publication.
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KEYWORDS
Sensors

Tomography

Microscopy

Diffraction

3D image processing

Reconstruction algorithms

3D metrology

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