Terahertz generalized Mueller-matrix ellipsometry

T. Hofmann; U. Schade; C. M. Herzinger; P. Esquinazi; M. Schubert

doi:10.1117/12.660382

7 March 2006 Terahertz generalized Mueller-matrix ellipsometry

T. Hofmann, U. Schade, C. M. Herzinger, P. Esquinazi, M. Schubert

Proceedings Volume 6120, Terahertz and Gigahertz Electronics and Photonics V; 61200D (2006) https://doi.org/10.1117/12.660382
Event: Integrated Optoelectronic Devices 2006, 2006, San Jose, California, United States

Abstract

We report on the first successful generalized Mueller-matrix ellipsometry measurements in the THz-frequency domain using the high-brilliance THz synchrotron radiation source IRIS at the electron storage ring BESSY, Germany. Generalized Ellipsometry, which is known as a powerful tool for measurement of optical constants including anisotropy and which was previously used in the FIR to VUV spectral range, is now employed for the first time to investigate condensed matter samples in the frequency range from 0.9 to 8 THz (30 to 650 cm^-1). Exemplarily, results obtained from bound and unbound charge-carrier investigations in low-dimensional semi- and superconducting systems are presented. Future applications of this technique for investigation of charge-carrier dynamics in magnetic fields are envisioned.

Citation Download Citation

T. Hofmann, U. Schade, C. M. Herzinger, P. Esquinazi, and M. Schubert "Terahertz generalized Mueller-matrix ellipsometry", Proc. SPIE 6120, Terahertz and Gigahertz Electronics and Photonics V, 61200D (7 March 2006); https://doi.org/10.1117/12.660382

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