Study on cooling control of APD in the single-photon detection system

Jinyun Zhou; Wen-yan Pei; Wei-jiang Wang; Chang-jun Liao; Song-hao Liu

doi:10.1117/12.674196

9 June 2006 Study on cooling control of APD in the single-photon detection system

Jinyun Zhou, Wen-yan Pei, Wei-jiang Wang, Chang-jun Liao, Song-hao Liu

Proceedings Volume 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 614909 (2006) https://doi.org/10.1117/12.674196
Event: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2005, Xian, China

Abstract

The low temperature control system of single photon detection device avalanche photodiode (APD) is researched. Avalanche photodiode is used for photon detector with high sensitivity. In order to reduce dark current, its operating environmental temperature needs to be lowered by a semiconductor thermoelectricity cooling apparatus. In accordance with the peculiarity of single photon detection system and the technology of semiconductor thermoelectric Peltier cooling, an APD cooling control system is designed and produced by properly selecting components and using some necessary control circuits. The accuracy and the lowest temperature of this control system can amount to 0.1^oC and -50^oC, respectively. Above all, the low temperature can be adjusted successively.

Citation Download Citation

Jinyun Zhou, Wen-yan Pei, Wei-jiang Wang, Chang-jun Liao, and Song-hao Liu "Study on cooling control of APD in the single-photon detection system", Proc. SPIE 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 614909 (9 June 2006); https://doi.org/10.1117/12.674196

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