Full Content is available to subscribers

Subscribe/Learn More  >
Proceedings Article

Determination of optical constants and thickness of Nb2O5 optical films from normal incidence transmission spectra

[+] Author Affiliations
Limei Lin, Fachun Lai, Zhiago Huang, Yan Qu, Rongquan Gai

Fujian Normal Univ. (China)

Proc. SPIE 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 614920 (June 09, 2006); doi:10.1117/12.674262
Text Size: A A A
From Conference Volume 6149

  • 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
  • Li Yang; Shangming Wen; Yaolong Chen; Ernst-Bernhard Kley
  • Xian, China | November 02, 2005

abstract

The optical constants and thickness of Nb2O5 optical thin film deposited by a reactive magnetron sputtering technique have been retrieved by all measurement data of the normal incidence transmittance. A computer program written in FORTRAN for determining the refractive index, extinction coefficient and thickness of this film has been developed and tested on two examples. This method can also calculate the optical constants and thickness of the film with a thickness thinner than a quarter wavelength optical thickness. Moreover, the optical constants calculated by this method are more accurate than those calculated by the envelope method. We also suggest that this method should be able to apply to other optical films, such as TiO2, SiO2 and Ta2O5.

© (2006) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Limei Lin ; Fachun Lai ; Zhiago Huang ; Yan Qu and Rongquan Gai
"Determination of optical constants and thickness of Nb2O5 optical films from normal incidence transmission spectra", Proc. SPIE 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 614920 (June 09, 2006); doi:10.1117/12.674262; http://dx.doi.org/10.1117/12.674262


Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).

Figures

Tables

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.