Paper
12 May 2006 Influence of temperature-dependent refractive index on thermal radiation from surface gratings
Hiroo Yugami, Takahiro Kamikawa, Yoshiaki Kanamori
Author Affiliations +
Abstract
We set up a high-temperature ellipsometry system for the measurement of optical constants n and k. The n and k values of refractory metals of W and Mo were measured from the visible (VIS) to near infrared (NIR) wavelength range at several temperatures by means of the system. The n drastically increases especially in the NIR region, while the k is almost invariant in all the range with increasing temperatures. Numerical simulation based on rigorous coupled-wave analysis (RCWA) with the values of n and k measured by high-temperature ellipsometry is qualitatively coincident with the measured spectral emissivity at high temperature. It has revealed that spectral emissivity has temperature dependence especially in the NIR region.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hiroo Yugami, Takahiro Kamikawa, and Yoshiaki Kanamori "Influence of temperature-dependent refractive index on thermal radiation from surface gratings", Proc. SPIE 6197, Photonics for Solar Energy Systems, 61970W (12 May 2006); https://doi.org/10.1117/12.662760
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Cited by 2 scholarly publications and 1 patent.
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KEYWORDS
Temperature metrology

Near infrared

Refractive index

Molybdenum

Metals

Ellipsometry

Reflectivity

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