Paper
18 April 2006 Phase sensitive digitized frequency modulated thermal wave imaging and pulse compression for NDE applications
Ravibabu Mulaveesala, Suneet Tuli
Author Affiliations +
Proceedings Volume 6205, Thermosense XXVIII; 620515 (2006) https://doi.org/10.1117/12.669530
Event: Defense and Security Symposium, 2006, Orlando (Kissimmee), Florida, United States
Abstract
A recently proposed novel technique for thermal non-destructive characterization based on digitized frequency modulated thermal waves is described. Defect detection in metallic, composite and semiconductor samples are presented as applications of digitized frequency modulated thermal wave imaging (DFMTWI). High peak power heat source requirement in pulsed thermography, and limited depth resolution of lock-in thermography due to fixed modulating frequency of sources, are over come by the proposed new technique by use of appropriately modulated excitation signal, limited both in time duration and frequency bandwidth.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ravibabu Mulaveesala and Suneet Tuli "Phase sensitive digitized frequency modulated thermal wave imaging and pulse compression for NDE applications", Proc. SPIE 6205, Thermosense XXVIII, 620515 (18 April 2006); https://doi.org/10.1117/12.669530
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Cited by 8 scholarly publications and 1 patent.
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KEYWORDS
Modulation

Thermography

Phase shift keying

Defect detection

Nondestructive evaluation

Annealing

Semiconducting wafers

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