Paper
13 October 2006 Heterodyne interferometer for measurement of in-plane displacement with subnanometer resolution
Ju-Yi Lee, Hui-Yi Chen, Cheng-Chih Hsu, Chyan-Chyi Wu
Author Affiliations +
Proceedings Volume 6280, Third International Symposium on Precision Mechanical Measurements; 62800J (2006) https://doi.org/10.1117/12.716145
Event: Third International Symposium on Precision Mechanical Measurements, 2006, Urumqi, China
Abstract
A novel method of the measurement of in-plane displacement is presented. This method includes a heterodyne light source, a moving grating and a lock-in amplifier for phase measurement. The phase variation which resulted from the grating movement is measured by an optical heterodyne interferometer. The short and long displacement can be measured by our method. The theoretical resolution is about 1 pm. If considering the high frequency noise, the measurement error or resolution is about 0.2 nm yet.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ju-Yi Lee, Hui-Yi Chen, Cheng-Chih Hsu, and Chyan-Chyi Wu "Heterodyne interferometer for measurement of in-plane displacement with subnanometer resolution", Proc. SPIE 6280, Third International Symposium on Precision Mechanical Measurements, 62800J (13 October 2006); https://doi.org/10.1117/12.716145
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Cited by 4 scholarly publications.
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KEYWORDS
Heterodyning

Interferometers

Phase measurement

Light sources

Optical amplifiers

Sensors

Geometrical optics

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