Direct wavefront phase measurement using point diffraction interferometer with application to large scale AO

Andrew K. Kirby; Thomas J. D. Oag; Gordon D. Love

doi:10.1117/12.679441

29 August 2006 Direct wavefront phase measurement using point diffraction interferometer with application to large scale AO

Andrew K. Kirby, Thomas J. D. Oag, Gordon D. Love

Author Affiliations +

Proceedings Volume 6306, Advanced Wavefront Control: Methods, Devices, and Applications IV; 63060I (2006) https://doi.org/10.1117/12.679441
Event: SPIE Optics + Photonics, 2006, San Diego, California, United States

Abstract

Interferometric techniques are attractive in wavefront sensing because they give a direct measure of the phase, which means they are useful for use with a piston-only wavefront corrector (such as a liquid crystal spatial light modulator, or some MEMS mirrors). We describe a novel method of implementing a common-path phase-shifting point diffraction interferometric wavefront sensor. The sensor simultaneously gives two phase-shifted outputs which can be used to drive a phase-only wavefront corrector. The device can also give a null output which can be used to calibrate any scintillation.

Citation Download Citation

Andrew K. Kirby, Thomas J. D. Oag, and Gordon D. Love "Direct wavefront phase measurement using point diffraction interferometer with application to large scale AO", Proc. SPIE 6306, Advanced Wavefront Control: Methods, Devices, and Applications IV, 63060I (29 August 2006); https://doi.org/10.1117/12.679441

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