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Proceedings Article

Surface inspection of hard to reach industrial parts using low-coherence interferometry

[+] Author Affiliations
M. L. Dufour, G. Lamouche, S. Vergnole, B. Gauthier, C. Padioleau, M. Hewko

National Research Council Canada (Canada)

S. Lévesque

Forensic Technology (Canada)

V. Bartulovic

Novacam Technologies Inc. (Canada)

Proc. SPIE 6343, Photonics North 2006, 63431Z (September 08, 2006); doi:10.1117/12.707806
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From Conference Volume 6343

  • Photonics North 2006
  • Pierre Mathieu
  • Quebec City, Canada | June 19, 2006

abstract

Optical inspection tools based on low-coherence interferometry and specialized for hard to reach industrial parts are presented. A common path configuration using optical fiber components is described. Small diameter probes originally developed for biomedical applications have been specialized for industrial inspection. Probes that can be used with a Cartesian surface scanning system or a cylindrical scanning system are presented. The probes include a reference that makes absolute accuracy measurements easier. Characterization of the internal surface of a worn plasma torch electrode has been realized using that technique. Surface profiling of the barrel of a gun was also performed.

© (2006) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

M. L. Dufour ; G. Lamouche ; S. Vergnole ; B. Gauthier ; C. Padioleau, et al.
"Surface inspection of hard to reach industrial parts using low-coherence interferometry", Proc. SPIE 6343, Photonics North 2006, 63431Z (September 08, 2006); doi:10.1117/12.707806; http://dx.doi.org/10.1117/12.707806


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