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Proceedings Article

Out-of-plane displacement derivative measurement: comparison of results obtained by a shearographic interferometer using the separation of the polarization states and the finite element method

[+] Author Affiliations
Vanessa Rosso, Lihong Zhang, Fabrice Michel, Yvon Renotte, Yves Lion, Anne-Marie Habraken

Univ. de Liège (Belgium)

Proc. SPIE 6343, Photonics North 2006, 634327 (September 08, 2006); doi:10.1117/12.707948
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From Conference Volume 6343

  • Photonics North 2006
  • Pierre Mathieu
  • Quebec City, Canada | June 19, 2006

abstract

An original experimental setup for shearography with metrological applications is presented herein. The simplicity and the efficiency of the setup are provided by a shearing device, a prism that separates the TE and TM polarization modes with a coating and a thin glass plate attached on its face. The temporal phase shifting method is applied through the use of a liquid crystal variable retarder. The use of this shearing device enables an in-line and almostcommon path configuration for the shearing interferometer, a path that leads to high stability of the interferometer and a low sensitivity to external disturbances. In order to prove the efficiency and the accuracy of this speckle shearing interferometer, the out-of-plane displacement derivative relative to the shearing interferometry direction of a centrally loaded steel plate has been measured by the shearographic interferometer and then compared with the out-of-plane displacement derivative computed from the displacement field provided by the finite element method. The results are in good agreement.

© (2006) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Vanessa Rosso ; Lihong Zhang ; Fabrice Michel ; Yvon Renotte ; Yves Lion, et al.
"Out-of-plane displacement derivative measurement: comparison of results obtained by a shearographic interferometer using the separation of the polarization states and the finite element method", Proc. SPIE 6343, Photonics North 2006, 634327 (September 08, 2006); doi:10.1117/12.707948; http://dx.doi.org/10.1117/12.707948


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