Paper
2 May 2007 Effects of mesh voids on insertion loss of metallic mesh coatings
Jennifer Halman, Keith Ramsey, Vashti Sawtelle
Author Affiliations +
Abstract
Metallic mesh thin-film coatings have been used for many years to provide electromagnetic interference (EMI) shielding on infrared windows and domes. During the fabrication of these conductive, micron-sized mesh patterns, mesh voids or holes in the mesh pattern occasionally occur. Voids in the mesh degrade the EMI shielding or insertion loss of the mesh coating. In the past, we have shown that a small number of 1-mm voids do not degrade the insertion loss significantly for 20-dB insertion-loss mesh coatings. In this paper, we present a theory that provides an approximation for the number and size of mesh voids that can be tolerated without degrading the EMI shielding properties of a mesh coating. We also measured the insertion loss of several typical metallic-mesh coatings with and without voids and compared the results with our simple insertion loss model. Our analysis shows that tens of very small voids may have only minimal impact on the EMI shielding properties of a metallic mesh coating. Even a single 3-mm diameter void may not degrade the shielding properties significantly.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jennifer Halman, Keith Ramsey, and Vashti Sawtelle "Effects of mesh voids on insertion loss of metallic mesh coatings", Proc. SPIE 6545, Window and Dome Technologies and Materials X, 65450X (2 May 2007); https://doi.org/10.1117/12.719807
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Electromagnetic coupling

Glasses

Antennas

Infrared radiation

Thin film coatings

Thin films

Electromagnetic interference

RELATED CONTENT


Back to Top