Application of planar waveguides with gradient index profile to determine parameters of thin active layers used in waveguide sensors

Elzbieta Augusciuk; Filip Sala

doi:10.1117/12.724528

16 May 2007 Application of planar waveguides with gradient index profile to determine parameters of thin active layers used in waveguide sensors

Elzbieta Augusciuk, Filip Sala

Author Affiliations +

Proceedings Volume 6585, Optical Sensing Technology and Applications; 65852D (2007) https://doi.org/10.1117/12.724528
Event: International Congress on Optics and Optoelectronics, 2007, Prague, Czech Republic

Abstract

The presence of thin cover layer on planar waveguide influences its propagation characteristics. A generalized m-line spectroscopy method enables the evaluation of the parameters (the refractive index, n and the thickness, t) of the subguiding layers deposited on a planar waveguide. In this paper algorithm for determination of the parameters of the thin layer (deposited on waveguide with previously evaluated index profile by m-line method) has been presented.

Citation Download Citation

Elzbieta Augusciuk and Filip Sala "Application of planar waveguides with gradient index profile to determine parameters of thin active layers used in waveguide sensors", Proc. SPIE 6585, Optical Sensing Technology and Applications, 65852D (16 May 2007); https://doi.org/10.1117/12.724528

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